International Test Solutions - Probe Card Cleaning Technology

Description: Complete probe card cleaning solution for probe cards used in IC wafer testing. Products for all manufacturers, probe card types and probe materials. Probe card cleaning material is based on non-abrasive material with options for abrasive cleaning.

Keywords: probe cleaning, probe needle cleaning, probe card cleaning, probe clean, probe scrub, probe polish, non-abrasive cleaning polymer, abrasive cleaning polymer

Tags: inttest, probe, cleaning, test, card, semicon, learn, solutions, international, technology, workshop, non, needle, abrasive, debris, contact, tech, distributors, support, products, japan, polymer, west, korea, singapore, taiwan, europa, bits, china, wafer, itc, material, collection, destructive, scrub, polish, clean, socket, loose, tip,

Inttest.net

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INTTEST.NET - Site Location
Country/Flag	United States
City/Region/Zip Code	Jacksonville, Florida, 32258
Organization	Defense.Net
Internet Service Provider	Web.com