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Characterizer
: 3 results found.
AFM probe tips for scanning probe microscopy - silicon mems - Team Nanotec
afm probe tips for scanning probe microscopy and silicon mems components manufactured by team nanotec, covers silicon etching, microfabrication, microoptics, nanotechnology, nanofabrication
Team-nanotec.com
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AURORA NANODEVICES INC. -- Calibration devices for atomic force microscopy
atomic force microscope, AFM, AFM tip characterizer, calibration
Aurorand.com
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