In-Situ Ellipsometers from HORIBA Jobin Yvon - HORIBA HORIBA Jobin Yvon ellipsometers combine two key elements: phase modulation and an entirely numerical data acquisition and processing system. It allows real-time measurements two orders of magnitude faster than classical ellipsometers. For industrial research or analytical laboratories, our ellipsometry products are the safest, easiest to operate, and most flexible instruments available. Jyprocesscontrol.com~Site InfoWhoisTrace RouteRBL Check
Spectroscopic Ellipsometers - HORIBA HORIBA Jobin Yvon ellipsometers combine two key elements: phase modulation and an entirely numerical data acquisition and processing system. It allows real-time measurements two orders of magnitude faster than classical ellipsometers. For industrial research or analytical laboratories, our ellipsometry products are the safest, easiest to operate, and most flexible instruments available. Smartuvisel.com~Site InfoWhoisTrace RouteRBL Check
Spectroscopic Ellipsometers - J.A. Woollam Co. J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR. Jawoollam.com~Site InfoWhoisTrace RouteRBL Check
FilmTek™ Spectroscopic Ellipsometers FilmTek™ 2000SE Spectroscopic Ellipsometers. FilmTek™ spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with multi angle reflectometry for accurate film thickness measurement Spectroscopicellipsometers.com~Site InfoWhoisTrace RouteRBL Check
