Ellipsometry

Thin Film - HORIBA
Thin Film metrology, ellipsometry and process control
Ellipsometry.co.uk ~

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Angstrom Sun Technologies Inc: Optical Solutions for Thin Films - Spectroscopic Ellipsometer, reflectometer, microspectrophotometer, microreflectometer with ellipsometry or photometry
Angstrom Sun Technologies Inc, a professional company that provides thin film thickness and optical constants measurement systems, including Spectroscopic Ellipsometer, reflectometer, microspectrophotometer, microreflectometer with ellipsometry or photometry
Angstec.com ~

Spectroscopic Ellipsometers - J.A. Woollam Co.
J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
Jawoollam.com ~

Home - NanoCharM
Nanocharm - Multifunctional NanoMaterials Characterization exploiting Ellipsometry and Polarimetry
Nanocharm.org ~

Optical Measurement and Testing solutions
We deliver inovative solutions for your optical measurement and testing problems and provide an extensive package of testing services and consultancy
Omtsolutions.com ~

InterOmni Technologies
InterOmni Technologies, specializing in Ellipsometry.
Inomtech.com ~

FilmTek™ Spectroscopic Ellipsometers
FilmTek™ 2000SE Spectroscopic Ellipsometers. FilmTek™ spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with multi angle reflectometry for accurate film thickness measurement
Spectroscopicellipsometers.com ~

Windsor Scientific | Windsor Scientific - 20 years in business!
Windsor Scientific provides electrochemical, metrological and analytical equipment and support to the scientific community.
Windsorscientific.com ~

Similar Sites: windsorscientific.co.uk

Crystals & Optical Components Manufacturer - JH Optek from China
Crystals & Optical Components Manufacturer JH Optek from China, we could produce crystals, optical components, birefringent crystal, laser crystal, NLO crystal, passive crystal, E-O Q crystal, Farady crystal, optical crystal, optical glass, clolor glass, waveplate, polarizer, PBS, lens, prism, optical windows, E-O Q switch, A-O Q switch, green laser module,and Fiber Microscopes.
Jhoptek.com ~

Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design
Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectronics, optics, photonics, data storage, display, micro electromechanical system (MEMS), nanotechnology, and optical coating industries)
Sci-soft.com ~